Iterative test generation method suits for circuits with
A) no feedback loops
B) few feedback loops
C) more feedback loops
D) negative feedback loops only
Correct Answer:
Verified
Q5: Which constitutes the test vectors in sequential
Q6: Outputs are functions of
A)present state
B)previous state
C)next state
D)present
Q7: Which is the delay elements for clocked
Q8: Which contributes to the necessary delay element?
A)flip-flops
B)circuit
Q9: In an OR gate, if A and
Q11: Which method is very time consuming?
A)d-algorithm
B)iterative test
Q12: In this iterative test generation method, sequential
Q13: For a NAND gate, struck-at 1 fault
Q14: Any condition that causes a processor to
Q15: In this technique, a simple fault manifests
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