In this technique, a simple fault manifests into multiple N faults.
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Q10: Iterative test generation method suits for circuits
Q11: Which method is very time consuming?
A)d-algorithm
B)iterative test
Q12: In this iterative test generation method, sequential
Q13: For a NAND gate, struck-at 1 fault
Q14: Any condition that causes a processor to
Q16: The contention for the usage of a
Q17: The situation wherein the data of operands
Q18: The stalling of the processor due to
Q19: The time lost due to the branch
Q20: _method is used in centralized systems to
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